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An in depth comparison of s-t reliability algorithms over uncertain graphs

  • Nanyang Technological University

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)864-876
Number of pages13
JournalProceedings of the VLDB Endowment
Volume12
Issue number8
DOIs
StatePublished - 2018
Externally publishedYes
Event45th International Conference on Very Large Data Bases, VLDB 2019 - Los Angeles, United States
Duration: Aug 26 2017Aug 30 2017

ASJC Scopus Subject Areas

  • Computer Science (miscellaneous)
  • General Computer Science

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